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US Patent Issued to MONTAGE TECHNOLOGY on May 12 for "Detection structure for chip edge cracks and detection method thereof" (Chinese Inventor)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,109, issued on May 12, was assigned to MONTAGE TECHNOLOGY Co. LTD. (Shanghai). "Detection structure for chip edge cracks and detection metho... Read More


US Patent Issued to JENTEK Sensors on May 12 for "Complex part inspection with eddy current sensors" (Massachusetts, Florida Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,110, issued on May 12, was assigned to JENTEK Sensors Inc. (Marlborough, Mass.). "Complex part inspection with eddy current sensors" was inv... Read More


US Patent Issued to YOKOGAWA ELECTRIC on May 12 for "Measurement apparatus and measurement method" (Japanese Inventor)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,111, issued on May 12, was assigned to YOKOGAWA ELECTRIC Corp. (Tokyo). "Measurement apparatus and measurement method" was invented by Rai I... Read More


US Patent Issued to TE CONNECTIVITY SOLUTIONS on May 12 for "Housing of an ultrasonic sensor" (Pennsylvania, Virginia Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,112, issued on May 12, was assigned to TE CONNECTIVITY SOLUTIONS GmbH (Schaffhausen, Switzerland). "Housing of an ultrasonic sensor" was inv... Read More


US Patent Issued to Qisda on May 12 for "Ultrasonic transducing module and ultrasonic probe" (Taiwanese Inventor)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,113, issued on May 12, was assigned to Qisda Corp. (Taoyuan City, Taiwan). "Ultrasonic transducing module and ultrasonic probe" was invented... Read More


US Patent Issued to The Boeing on May 12 for "Methods for associating test data for part under test with end item coordinate system and systems associated therewith" (Washington Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,114, issued on May 12, was assigned to The Boeing Co. (Arlington, Va.). "Methods for associating test data for part under test with end item... Read More


US Patent Issued to SHIMADZU on May 12 for "Sample vaporization unit and gas chromatograph" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,115, issued on May 12, was assigned to SHIMADZU Corp. (Kyoto, Japan). "Sample vaporization unit and gas chromatograph" was invented by Kiyon... Read More


US Patent Issued to SHIMADZU on May 12 for "Gas monitoring device for gas chromatograph" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,116, issued on May 12, was assigned to SHIMADZU Corp. (Kyoto, Japan). "Gas monitoring device for gas chromatograph" was invented by Yuki Kom... Read More


US Patent Issued to Roche Diagnostics Operations on May 12 for "Quality control tools for LC-MS" (German Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,117, issued on May 12, was assigned to Roche Diagnostics Operations Inc. (Indianapolis). "Quality control tools for LC-MS" was invented by D... Read More


US Patent Issued to Thermo Finnigan on May 12 for "Idle-triggered diagnostics for scientific instruments" (Texas Inventor)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,118, issued on May 12, was assigned to Thermo Finnigan LLC (San Jose, Calif.). "Idle-triggered diagnostics for scientific instruments" was i... Read More